Leon-Garzon A, Manenti F, Dotelli G, Villa A, Barbieri L, Gondola M. Lumped Mechanism for Polymeric Dielectric Degradation Under High Electrical Fields. Chemical Engineering Transactions [Internet]. 20May2015 [cited 22Dec.2024];43:1711-6. Available from: https://www.cetjournal.it/index.php/cet/article/view/CET1543286